Nauka innov. 2013, 9(3):13-18
https://doi.org/10.15407/scin9.03.013

I.P. Zharkov1, O.M. Ivashchenko1, E.M. Rudenko2, I.V. Korotash2, A.A. Krakovnyy2, V.V. Safronov1, V.A. Khodunov1, А.E. Rudenko3
1 Institute of Physics, NAS of Ukraine, Kiev
2 Institute of Metal Physics, NAS of Ukraine, Kyiv
3 International Center for Electron Beam Technologies of Electric Welding Institute, NAS of Ukraine, Kyiv

 

The Low-Temperature Device for Microwave Non-Destructive Defectoscopy

Section: Scientific Basis of Innovation Activity
Language: Russian
Abstract: The new device for microwave non-destructive defectoscopy with minimum thermal noises and increased signal /noise ratio, which used scanning nitrogen filled cryostat with integrated active microwave elements, is designed.
Key words: microwave non-destructive defectoscopy, nitrogen cryostat, scanner.

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References:
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