Determination of Sapphire Stoichiometry by X-RAY Scattering
Title | Determination of Sapphire Stoichiometry by X-RAY Scattering |
Publication Type | Journal Article |
Year of Publication | 2011 |
Authors | Safronov, RI |
Short Title | Nauka innov. |
DOI | 10.15407/scin7.03.036 |
Volume | 7 |
Issue | 3 |
Section | Scientific and Technical Innovative Projects of National Academy of Sciences of Ukraine |
Pagination | 36-38 |
Language | Ukrainian |
Abstract | The possibility of sapphire stoichiometry determination by X-ray dispersion measurements was studied. The measurements were carried out using the X-ray fluorescent spectrometer adjusted in X-ray optical scheme with the secondary radiation source. The parameters measured were X-ray dispersion integral intensities of coherent (Ik) and incoherent (Ir) peaks. The concentrations of the F- and F + centers were measured by the optical absorption at 206, 225 and 255 nm wavelengths. The existence of a certain relation between Ik/Ir value and sapphire stoichiometry was revealed. The formula for cation vacancies quantity determination in the sapphire is proposed.
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Keywords | non-destructive testing methods, stoichiometry of crystal composition, X-ray fluorescent spectrometer, X-ray scattering |
References | 1. Dobrovinskaja E.R., Litvinov L.A., Pishhik V.V. Enciklopedija sapfira. Har'kov: Institut monokristallov [in Russian].
2. Anisovich K.V. Perspektivy povyshenija chuvstvitel'nosti fluorescentnogo rentgenovskogo analiza. Apparatura i metody rentgenovskogo analiza. 1980. Vyp. 24. S. 61-70 [in Russian]. 3. Mikhailov I.F., Sobol O.V., Varganov V.V., Fomina L.P. Determination of mass fraction of light elements in crystalline materials by the Compton-to-Rayleigh scattering in tensity ratio. Functional Materials. 2002. 9(4): 651-657. 4. Vishnevsky S.D., Krivonosov E.V., Litvinov L.A. Formation and diffusion of anionic vacancies in leucosapphire. Functional Materials. 2003. 10(2): 238-242. |