Determination of Sapphire Stoichiometry by X-RAY Scattering

TitleDetermination of Sapphire Stoichiometry by X-RAY Scattering
Publication TypeJournal Article
Year of Publication2011
AuthorsSafronov, RI
Short TitleNauka innov.
DOI10.15407/scin7.03.036
Volume7
Issue3
SectionScientific and Technical Innovative Projects of National Academy of Sciences of Ukraine
Pagination36-38
LanguageUkrainian
Abstract
The possibility of sapphire stoichiometry determination by X-ray dispersion measurements was studied. The measurements were carried out using the X-ray fluorescent spectrometer adjusted in X-ray optical scheme with the secondary radiation source. The parameters measured were X-ray dispersion integral intensities of coherent (Ik) and incoherent (Ir) peaks. The concentrations of the F- and F + centers were measured by the optical absorption at 206, 225 and 255 nm wavelengths. The existence of a certain relation between Ik/Ir value and sapphire stoichiometry was revealed. The formula for cation vacancies quantity determination in the sapphire is proposed.
Keywordsnon-destructive testing methods, stoichiometry of crystal composition, X-ray fluorescent spectrometer, X-ray scattering
References
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