8(2)08

Nauka innov. 2012, 8(2):39–42
https://doi.org/10.15407/scin8.02.039

A. Derzhypolskyi1, D. Melenevskyi1,2
1TOV «NOVATSII»,
2Institute of Physics NAS of Ukraine, Kiev

 

Transmission Electron Microscopy Past and Present: Pushing the Limits of Cognition

Section: The World of Innovations
Language: Russian
Abstract: The paper gives a brief review of the principal milestones of development of electron microscopy. Main attention is paid to the most advanced achievements in technique of transmission electron microscopy. Described are the state of the-art microscopes with 5th order aberration correction giving images with sub-angstrom spatial resolution.
Key words: transmission electron microscopy, aberration correction, atomic resolution, single atom identification.

References:
1. Aberration correction past and present . Phil. Trans. R.Soc. A. 2009. vol. 367. No. 1903. P. 3637-3664.
2. Krivanek O.L., Dellby N., Spence A.J. et all. Aberration correction in the STEM . In: Inst. Phys. Conf. Ser. 153 (Proceedings 1997 EMAG meeting) Ed. Rodenburg JM, 35. University of Cambridge, 2-5 September. 1997.
3. Batson P.E., Dellby N. and Krivanek O.L. Sub-ångstrom resolution using aberration corrected electron optics. Nature. 2002. No. 418. P. 617.
https://doi.org/10.1038/nature00972
4. N. Dellby et al. Optimized quadrupole-octupole C3/C5 corrector for STEM. CPO7 proceedings. 2006. P. 97.
5. Krivanek O.L. et al. Aberration Correction in STEM (Chapter in Handbook of Charged Particle Optics, Jon Orloff, ed., CRC Press). 2008.
6. Krivanek O.L. at al. An electron microscope for the aberration-correctedera. Ultramicroscopy. Volume 108, Issue 3, February 2008. P. 179-195.
https://doi.org/10.1016/j.ultramic.2007.07.010
7. Muller D.A., Fitting Kourkoutis L., Murfitt M. et all. Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy. Science. 319. 2008. P. 1073.
https://doi.org/10.1126/science.1148820
8. Krivanek O.L., Chisholm M.F., Nicolosi V. et all. Atombyatom structural and chemical analysis by annular dark field electron microscopy. Nature. 2010. 464. -P. 571-574.
9. Krivanek O.L., Dellby N., Murfitt M.F. et all. Gentle STEM: ADF imaging and EELS at low primary energies Ultra microscopy. 110. P. 935-945.
https://doi.org/10.1016/j.ultramic.2010.02.007
10. Varela M., Findlay S.D., Lupini A.R et all. (2004) Spectroscopic Imaging of Single Atoms Within a Bulk Solid. Phys. Rev. Lett. 92. P. 095502.
https://doi.org/10.1103/PhysRevLett.92.095502